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Wafer Fabs Available for Sale!!!

Note: All systems and fabs are subject to availability at time and date of inquiry.

Please feel free to search for the product you came for. Products in this site are Indexed by the FreeFind Search Engine.

CD SEM, Hitachi S-8840

• Wafer size: 8 inches
• Image Resolution: X110 (optical microscope)
• X1,000 - 150,000 (sem image)
• Meas. Mode: automatic edge detection, definable algorithms
• Meas. Range: 0.1 - 10 micrometer
• Reproducibility: +-1% or 5 nanometer (3 sigma) whichever is greater
• Objective lens: highly excited low abberation type
• Movement: 200 mm X 200 mm
• Speed: 50 nm/sec
• Auto Loader: 2 cassette random access
• Automatic wafer alignment using optical microscope
• Throughput: 20 wafers/hr (5 pt meas. Continuous operation)
• Vacuum System: Fully automatic dry vac system with 3 ion pumps, 2 turbo pumps and 2 rotary pumps

Conversion to 6 inch wafers . . . . . Option

Reference: Stxi813-S8840

Please call or   click here  to inquire for prices. Please include reference.

Note: Subject to availability at time and date of inquiry.

Refurbished Semiconductor Equipment, SEM, Scanning Electron Microscopes, KLA Measurement Systems, Etc.

• Hitachi S-2700 Lab 6 SEM
• Hitachi S-806C FE-SEM with EDS system (Oxford X-Ray) and infrared chamberscope, very good condition, 8 inch wafer capable
• Hitachi S-6000 CD-SEM, with new proprietory PC and software
• Hitachi S-8640 CD-SEM for R-W head and mask reticle inspection, High throughput
• Hitachi S-8820 CD-SEM
• Hitachi S-4500 FE-SEM
• Hitachi S-6280 CD-SEM
• Hitachi S-570 SEM with LAB6 source
• SEMTRONIX 791 RIE with 6 process gases, can be used for delayering 12 inch wafers or any wafer size & package
• KLA 5000 CD-SEM measurement system
• KLA 5107 Overlay inspection system
• KLA 5100 Overlay inspection system
• KLA 2131E Defect inspection system
• MICRION 9800 Focused Ion Beam FOR 8 inch wafer, good for cross section in micro area
• Perkin-Elmer 660 Auger Electron Microscopy, like new
• ALESSI 2100 probe station
• LEITZ Ergoplan 200 Laser microscope, auto focus
• JEOL JSM-ICA848A SEM wafer inspection system
• JEOL FIB 500 Focused Ion Beam Milling System
• JEOL 100CX TEM
• JEOL 840 Field Emission SEM
• JEOL 5600 SEM
• JEOL 1010 TEM
• JEOL 6340 Field Emission SEM + Noran Voyager X-Ray
• JEOL 4000 EX TEM 400 kv
• JEOL 200 CX TEM 200 kv
• JEOL 1200 EX TEM 120 kv
• JEOL FX-90Q NMR + Tecmag
• JEOL T330 SEM
• FEI 300 Focus Ion Beam
• PHI 600 Scanning Auger with PC upgrade
• PHI 670 Hres Scanning Auger system
• PHI 5200 XPS System Based on PHI 10-360 SCA
• PHI 660 Scanning AES system with PC Upgrade
• MRC Summit Inline Sputtering System
• 3500 SIMSII Dynamic SIMS, includes 06-600 Spherical SIMS Energy analyzer, 1-255AMU RF generator, 16mm Quadrupole, 32-055 SIMS controller, 32-600 Quadrupole control, 02 leak valve, 1120 amplifier discriminator, all cables and manuals
• VG 310 XPS, AES
• ISI 193 Mcrostep stepper, 193 nm with spare Cymer Laser
• Dynatex DX III Scriber, Windows Operating System
• LEEDS 10-180 & 11-020 controller. This unit has been used only once, and has been stored under vacuum
• Semitool 860D Spin-Rinse-Dryer
• Semitool 870D Spin-Rinse-Dryer
• EDAX EX-4 EDS system for conventional SEM

Reference: Stxi7133a

If interested in any item above, please click here. Please include reference.

Note: All products are subject to availability at time and date of inquiry.

Reference: Stxi7133b

Five Inch Wafer Fab or Semiconductor Processing Equipment List - C2C

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Semiconductor Equipment Resource Center

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